An international optical microscopy event-“Focus on Microscopy 2010”
نویسندگان
چکیده
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملOptical Microscopy
binocular microscopes with image-erecting prisms, and the first stereomicroscope (14). Early in the twentieth century, microscope manufacturers began parfocalizing objectives, allowing the image to remain in focus when the microscopist exchanged objectives on the rotating nosepiece. In 1824, Zeiss introduced a LeChatelier-style metallograph with infinitycorrected optics, but this method of corr...
متن کاملExtended focus depth for Fourier domain optical coherence microscopy.
We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of approximately 1.5 microm along a focal range of 200 microm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution ...
متن کاملNoise analysis for through-focus scanning optical microscopy.
A systematic noise-analysis study for optimizing data collection and data processing parameters for through-focus scanning optical microscopy (TSOM) is presented. TSOM is a three-dimensional shape metrology method that can achieve sub-nanometer measurement sensitivity by analyzing sets of images acquired through focus using a conventional optical microscope. We show that the best balance betwee...
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ژورنال
عنوان ژورنال: Chinese Science Bulletin
سال: 2010
ISSN: 1001-6538,1861-9541
DOI: 10.1007/s11434-010-9990-z